The Budapest University of Technology and Economics is one of the leading technical universities of Central Europe. Its historical excellence is demonstrated with the numerous Nobel Prize holders of former graduates of BME. The Department of Electron Devices is a worldwide recognized research organization in the field of thermal and electro-thermal issues in microelectronic devices. The Department deals with all aspects of microelectronics, from semiconductor physics through device manufacturing to system level design. The multi physics knowledge of the researchers is exploited by their work in a number of European projects. The first EU supported international project of the Department THERMINIC resulted in the creation of the THERMINIC Workshop, that has grown since then into a worldwide recognized leading scientific event with participants from 30-40 countries regularly. This project has also led to the creation of MicReD, the spin off company of the Department that has become a worldwide recognized provider of electronics thermal tools, now as part of Mentor Graphics.

Staff members:

Professor Marta Rencz, the Head of department, will be responsible for the scientific work BME carries out in the project. She has published her research results in about 300 scientific papers, out of which about 200 deals with various aspects of characterization of the thermal issues in electronics. For her research in thermal modeling in electronics together with Vladimir Székely she was honored with the Harvey Rosten award of excellence by the international community of researchers.


Professor Vladimir Székely is a member of the Hungarian Academy of Sciences. He has published his research results in about 400 papers. He has developed the mathematical background of the structure function based thermal transient methodology that is used today worldwide by the electronics to assess the quality of thermal interfacing, and which became the JEDEC standard in 2010. He will work on refining the mathematical methodology to increase the resolution of the method to enable it for the characterization of the novel devices developed in the project.